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Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS

This paper presents the first fully integrated radiation-tolerant All-Digital Phase-Locked Loop (PLL) and Clock and Data Recovery (CDR) circuit for wireline communication applications. Several radiation hardening techniques are proposed to achieve state-of-the-art immunity to SingleEvent Effects (SE...

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Detalles Bibliográficos
Autores principales: Biereigel, Stefan, Kulis, Szymon, Moreira, Paulo, Kölpin, Alexander, Leroux, Paul, Prinzie, Jeffrey
Lenguaje:eng
Publicado: 2021
Materias:
Acceso en línea:https://dx.doi.org/10.3390/electronics10222741
http://cds.cern.ch/record/2807905