Cargando…
Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks
Low-frequency resistance fluctuations cause excess noise in biased resistors. The magnitude of these fluctuations varies significantly between different resistor types. In this work measurements of excess noise in precision thin film and metal foil resistor networks are presented. The lowest levels...
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2022
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/I2MTC48687.2022.9806690 http://cds.cern.ch/record/2814429 |