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Prospects for computer-assisted data quality monitoring at the CMS pixel detector

Data quality monitoring (DQM) and data certification (DC) are of vital importance to advanced detectors such as CMS, and are key ingredients in assuring the correctness of results in high-level physics analyses. The current approach for DQM and DC at CMS is mainly based on manual monitoring of refer...

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Detalles Bibliográficos
Autor principal: Lambrecht, Luka
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2022.167495
http://cds.cern.ch/record/2815415