Single event effects on the RD53B pixel chip digital logic and on-chip CDR

The RD53B chip for HL-LHC upgrades of ATLAS and CMS pixel detectors needs to provide reliable operation in a radiation hostile environment with inevitable Single Event Effects (SEE). To answer the challenge, substantial efforts are made to protect and evaluate the critical parts of the digital logic...

Descripción completa

Detalles Bibliográficos
Autores principales: Lalic, J, Fougeron, D, Madsen, E, Joly, E R A, Christiansen, J, Flores Sanz De Acedo, L, Menouni, M, Standke, M, Barrillon, P, Rymaszewski, P, Strebler, T
Lenguaje:eng
Publicado: 2022
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/17/05/C05001
http://cds.cern.ch/record/2824097

Internet

https://dx.doi.org/10.1088/1748-0221/17/05/C05001
http://cds.cern.ch/record/2824097

Ejemplares similares