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Single event effects on the RD53B pixel chip digital logic and on-chip CDR
The RD53B chip for HL-LHC upgrades of ATLAS and CMS pixel detectors needs to provide reliable operation in a radiation hostile environment with inevitable Single Event Effects (SEE). To answer the challenge, substantial efforts are made to protect and evaluate the critical parts of the digital logic...
| Autores principales: | , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2022
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/17/05/C05001 http://cds.cern.ch/record/2824097 |
| _version_ | 1780973671193509888 |
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| author | Lalic, J Fougeron, D Madsen, E Joly, E R A Christiansen, J Flores Sanz De Acedo, L Menouni, M Standke, M Barrillon, P Rymaszewski, P Strebler, T |
| author_facet | Lalic, J Fougeron, D Madsen, E Joly, E R A Christiansen, J Flores Sanz De Acedo, L Menouni, M Standke, M Barrillon, P Rymaszewski, P Strebler, T |
| author_sort | Lalic, J |
| collection | CERN |
| description | The RD53B chip for HL-LHC upgrades of ATLAS and CMS pixel detectors needs to provide reliable operation in a radiation hostile environment with inevitable Single Event Effects (SEE). To answer the challenge, substantial efforts are made to protect and evaluate the critical parts of the digital logic and to characterize the on-chip Clock and Data Recovery (CDR) circuit. The SEE sensitivity of the digital logic is evaluated by testing with both heavy-ions and protons. The on-chip CDR is characterized by measuring the SEE-induced phase shifts of its output clocks and their implication on the high-speed link stability. |
| id | cern-2824097 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2022 |
| record_format | invenio |
| spelling | cern-28240972022-08-05T20:53:12Zdoi:10.1088/1748-0221/17/05/C05001http://cds.cern.ch/record/2824097engLalic, JFougeron, DMadsen, EJoly, E R AChristiansen, JFlores Sanz De Acedo, LMenouni, MStandke, MBarrillon, PRymaszewski, PStrebler, TSingle event effects on the RD53B pixel chip digital logic and on-chip CDRDetectors and Experimental TechniquesThe RD53B chip for HL-LHC upgrades of ATLAS and CMS pixel detectors needs to provide reliable operation in a radiation hostile environment with inevitable Single Event Effects (SEE). To answer the challenge, substantial efforts are made to protect and evaluate the critical parts of the digital logic and to characterize the on-chip Clock and Data Recovery (CDR) circuit. The SEE sensitivity of the digital logic is evaluated by testing with both heavy-ions and protons. The on-chip CDR is characterized by measuring the SEE-induced phase shifts of its output clocks and their implication on the high-speed link stability.oai:cds.cern.ch:28240972022 |
| spellingShingle | Detectors and Experimental Techniques Lalic, J Fougeron, D Madsen, E Joly, E R A Christiansen, J Flores Sanz De Acedo, L Menouni, M Standke, M Barrillon, P Rymaszewski, P Strebler, T Single event effects on the RD53B pixel chip digital logic and on-chip CDR |
| title | Single event effects on the RD53B pixel chip digital logic and on-chip CDR |
| title_full | Single event effects on the RD53B pixel chip digital logic and on-chip CDR |
| title_fullStr | Single event effects on the RD53B pixel chip digital logic and on-chip CDR |
| title_full_unstemmed | Single event effects on the RD53B pixel chip digital logic and on-chip CDR |
| title_short | Single event effects on the RD53B pixel chip digital logic and on-chip CDR |
| title_sort | single event effects on the rd53b pixel chip digital logic and on-chip cdr |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1088/1748-0221/17/05/C05001 http://cds.cern.ch/record/2824097 |
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