How the Analysis of Archival Data Could Provide Helpful Information About TID Degradation. Case Study: Bipolar Transistors

A critical step of radiation hardness assurance (RHA) for space systems is given by the parts selection in accordance with the observed (or estimated) radiation effects. Although radiation testing is the most decisive way of studying the radiation degradation of electronic components, the increasing...

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Detalles Bibliográficos
Autores principales: Martín-Holgado, Pedro, Romero-Maestre, Amor, de-Martín-Hernández, José, González-Luján, José J, Illera-Gómez, Iván, Jiménez-de-Luna, Yolanda, Morilla, Fernando, Barbero, Mario Sacristan, Garcia Alia, Rubén, Domínguez, Manuel, Morilla, Yolanda
Lenguaje:eng
Publicado: 2022
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/TNS.2022.3185940
http://cds.cern.ch/record/2824342

Internet

https://dx.doi.org/10.1109/TNS.2022.3185940
http://cds.cern.ch/record/2824342

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