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Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver

This paper presents the characterization of total ionizing dose (TID) effects on an highly-integrated radio frequency (RF) agile transceiver to ultra-high dose levels. The DUT shows no RF-specific degradation up to 40 Mrad(SiO$_2$). Malfunctions on the digital interfaces are assessed at ~45 Mrad(SiO...

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Detalles Bibliográficos
Autores principales: Budroweit, J, Jaksch, M, Borghello, G
Lenguaje:eng
Publicado: 2020
Materias:
Acceso en línea:https://dx.doi.org/10.1109/redw51883.2020.9325832
http://cds.cern.ch/record/2839255
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author Budroweit, J
Jaksch, M
Borghello, G
author_facet Budroweit, J
Jaksch, M
Borghello, G
author_sort Budroweit, J
collection CERN
description This paper presents the characterization of total ionizing dose (TID) effects on an highly-integrated radio frequency (RF) agile transceiver to ultra-high dose levels. The DUT shows no RF-specific degradation up to 40 Mrad(SiO$_2$). Malfunctions on the digital interfaces are assessed at ~45 Mrad(SiO$_2$) which results into a non-functional operation of the DUT. Additional TID testing to 80 Mrad(SiO$_2$) has been performed to investigate further behavior. Rebound effects during 100°C tempered post-test annealing to almost nominal operations are observed.
id cern-2839255
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
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spelling cern-28392552022-11-08T13:48:55Zdoi:10.1109/redw51883.2020.9325832http://cds.cern.ch/record/2839255engBudroweit, JJaksch, MBorghello, GUltra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile TransceiverNuclear Physics - TheoryThis paper presents the characterization of total ionizing dose (TID) effects on an highly-integrated radio frequency (RF) agile transceiver to ultra-high dose levels. The DUT shows no RF-specific degradation up to 40 Mrad(SiO$_2$). Malfunctions on the digital interfaces are assessed at ~45 Mrad(SiO$_2$) which results into a non-functional operation of the DUT. Additional TID testing to 80 Mrad(SiO$_2$) has been performed to investigate further behavior. Rebound effects during 100°C tempered post-test annealing to almost nominal operations are observed.oai:cds.cern.ch:28392552020
spellingShingle Nuclear Physics - Theory
Budroweit, J
Jaksch, M
Borghello, G
Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver
title Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver
title_full Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver
title_fullStr Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver
title_full_unstemmed Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver
title_short Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver
title_sort ultra-high total ionizing dose effects in a highly integrated and rf-agile transceiver
topic Nuclear Physics - Theory
url https://dx.doi.org/10.1109/redw51883.2020.9325832
http://cds.cern.ch/record/2839255
work_keys_str_mv AT budroweitj ultrahightotalionizingdoseeffectsinahighlyintegratedandrfagiletransceiver
AT jakschm ultrahightotalionizingdoseeffectsinahighlyintegratedandrfagiletransceiver
AT borghellog ultrahightotalionizingdoseeffectsinahighlyintegratedandrfagiletransceiver