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Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver
This paper presents the characterization of total ionizing dose (TID) effects on an highly-integrated radio frequency (RF) agile transceiver to ultra-high dose levels. The DUT shows no RF-specific degradation up to 40 Mrad(SiO$_2$). Malfunctions on the digital interfaces are assessed at ~45 Mrad(SiO...
Autores principales: | , , |
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Lenguaje: | eng |
Publicado: |
2020
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/redw51883.2020.9325832 http://cds.cern.ch/record/2839255 |
_version_ | 1780975954284249088 |
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author | Budroweit, J Jaksch, M Borghello, G |
author_facet | Budroweit, J Jaksch, M Borghello, G |
author_sort | Budroweit, J |
collection | CERN |
description | This paper presents the characterization of total
ionizing dose (TID) effects on an highly-integrated radio
frequency (RF) agile transceiver to ultra-high dose levels. The
DUT shows no RF-specific degradation up to 40 Mrad(SiO$_2$).
Malfunctions on the digital interfaces are assessed at ~45
Mrad(SiO$_2$) which results into a non-functional operation of the
DUT. Additional TID testing to 80 Mrad(SiO$_2$) has been
performed to investigate further behavior. Rebound effects
during 100°C tempered post-test annealing to almost nominal
operations are observed. |
id | cern-2839255 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2020 |
record_format | invenio |
spelling | cern-28392552022-11-08T13:48:55Zdoi:10.1109/redw51883.2020.9325832http://cds.cern.ch/record/2839255engBudroweit, JJaksch, MBorghello, GUltra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile TransceiverNuclear Physics - TheoryThis paper presents the characterization of total ionizing dose (TID) effects on an highly-integrated radio frequency (RF) agile transceiver to ultra-high dose levels. The DUT shows no RF-specific degradation up to 40 Mrad(SiO$_2$). Malfunctions on the digital interfaces are assessed at ~45 Mrad(SiO$_2$) which results into a non-functional operation of the DUT. Additional TID testing to 80 Mrad(SiO$_2$) has been performed to investigate further behavior. Rebound effects during 100°C tempered post-test annealing to almost nominal operations are observed.oai:cds.cern.ch:28392552020 |
spellingShingle | Nuclear Physics - Theory Budroweit, J Jaksch, M Borghello, G Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver |
title | Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver |
title_full | Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver |
title_fullStr | Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver |
title_full_unstemmed | Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver |
title_short | Ultra-High Total Ionizing Dose Effects in a Highly Integrated and RF-Agile Transceiver |
title_sort | ultra-high total ionizing dose effects in a highly integrated and rf-agile transceiver |
topic | Nuclear Physics - Theory |
url | https://dx.doi.org/10.1109/redw51883.2020.9325832 http://cds.cern.ch/record/2839255 |
work_keys_str_mv | AT budroweitj ultrahightotalionizingdoseeffectsinahighlyintegratedandrfagiletransceiver AT jakschm ultrahightotalionizingdoseeffectsinahighlyintegratedandrfagiletransceiver AT borghellog ultrahightotalionizingdoseeffectsinahighlyintegratedandrfagiletransceiver |