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Heavy-Ion Charge Yield Measurement by Floating Gate Dosimeters
An alternative technique for measuring the charge yield is explored in this paper. The charge yield is determined by measuring the fraction of electrons that survive the initial recombination. To this purpose, a silicon dosimeter based on a floating gate structure has been employed. Since the dosime...
Autores principales: | , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2021
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/RADECS53308.2021.9954559 http://cds.cern.ch/record/2846296 |
_version_ | 1780976625283760128 |
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author | Brucoli, Matteo Danzeca, Salvatore Waage, Aleksander Masi, Alessandro Alia, Rubén Garcia Mas, Bartomeu Severa Pineda, Alvaro Ferlet-Cavrois, Veronique |
author_facet | Brucoli, Matteo Danzeca, Salvatore Waage, Aleksander Masi, Alessandro Alia, Rubén Garcia Mas, Bartomeu Severa Pineda, Alvaro Ferlet-Cavrois, Veronique |
author_sort | Brucoli, Matteo |
collection | CERN |
description | An alternative technique for measuring the charge yield is explored in this paper. The charge yield is determined by measuring the fraction of electrons that survive the initial recombination. To this purpose, a silicon dosimeter based on a floating gate structure has been employed. Since the dosimeter’s active volume consists of field oxide (FOX) layers and works at low electric fields (< 0.1 MeV/cm), this technique allows investigating the charge collection under conditions similar to the those found in insolation oxides, which are the main reason for TID-induced degradation in scaled technologies.Finally, charge yield is measured independently from the hole trapping efficiency of the sensor’s SiO
2
.In this study, the floating gate dosimeter has been exposed to heavy ion beams with LETs ranging from 0.24 to 44 MeV∙cm
2
∙mg
1
. Its radiation response has been analyzed and the charge yield has been determined for the three ions. |
id | cern-2846296 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2021 |
record_format | invenio |
spelling | cern-28462962023-01-18T19:35:42Zdoi:10.1109/RADECS53308.2021.9954559http://cds.cern.ch/record/2846296engBrucoli, MatteoDanzeca, SalvatoreWaage, AleksanderMasi, AlessandroAlia, Rubén GarciaMas, Bartomeu SeveraPineda, AlvaroFerlet-Cavrois, VeroniqueHeavy-Ion Charge Yield Measurement by Floating Gate DosimetersDetectors and Experimental TechniquesAn alternative technique for measuring the charge yield is explored in this paper. The charge yield is determined by measuring the fraction of electrons that survive the initial recombination. To this purpose, a silicon dosimeter based on a floating gate structure has been employed. Since the dosimeter’s active volume consists of field oxide (FOX) layers and works at low electric fields (< 0.1 MeV/cm), this technique allows investigating the charge collection under conditions similar to the those found in insolation oxides, which are the main reason for TID-induced degradation in scaled technologies.Finally, charge yield is measured independently from the hole trapping efficiency of the sensor’s SiO 2 .In this study, the floating gate dosimeter has been exposed to heavy ion beams with LETs ranging from 0.24 to 44 MeV∙cm 2 ∙mg 1 . Its radiation response has been analyzed and the charge yield has been determined for the three ions.oai:cds.cern.ch:28462962021 |
spellingShingle | Detectors and Experimental Techniques Brucoli, Matteo Danzeca, Salvatore Waage, Aleksander Masi, Alessandro Alia, Rubén Garcia Mas, Bartomeu Severa Pineda, Alvaro Ferlet-Cavrois, Veronique Heavy-Ion Charge Yield Measurement by Floating Gate Dosimeters |
title | Heavy-Ion Charge Yield Measurement by Floating Gate Dosimeters |
title_full | Heavy-Ion Charge Yield Measurement by Floating Gate Dosimeters |
title_fullStr | Heavy-Ion Charge Yield Measurement by Floating Gate Dosimeters |
title_full_unstemmed | Heavy-Ion Charge Yield Measurement by Floating Gate Dosimeters |
title_short | Heavy-Ion Charge Yield Measurement by Floating Gate Dosimeters |
title_sort | heavy-ion charge yield measurement by floating gate dosimeters |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1109/RADECS53308.2021.9954559 http://cds.cern.ch/record/2846296 |
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