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General Purpose and Neural Network Approach for Benchmarking Microcontrollers Under Radiation
In this work a testing methodology for micro-controllers exposed to radiation is proposed. General purpose benchmarks are reviewed to provide a mean of testing all the macro-areas of a microcontroller, and a neural network benchmark is introduced as a representative class of novel computing algorith...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2021
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/RADECS53308.2021.9954496 http://cds.cern.ch/record/2846298 |