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Wavelet-based Noise Extraction for Anomaly Detection Applied to Safety-critical Electronics at CERN
Due to the possible damage caused by unforeseen failures of safety-critical systems, it is crucial to maintain these systems appropriately to ensure high reliability and availability. If numerous units of a system are installed in various areas and permanent access is not guaranteed, remote, data-dr...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2022
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.3850/978-981-18-5183-4_S02-03-080-cd http://cds.cern.ch/record/2848631 |