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Selection of 8-channel silicon phototransistor arrays for space applications, based on wafer-level radiation and high-temperature storage tests
One of the aspects that semiconductor devices have to cope with in space applications is radiation induced damage. Therefore, radiation hardness studies are crucial for the space missions and a comprehensive on-ground testing of the components needs to be performed aiming at identifying the most rad...
| Autores principales: | , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2022
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/s12567-022-00443-2 http://cds.cern.ch/record/2852834 |