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Analysis of inhomogeneities in Nb$_{3}$Sn wires by combined SEM and SHPM and their impact on J $_{c}$ and T $_{c}$
We demonstrate the combined use of scanning electron microscopy (SEM) and scanning Hall probe microscopy (SHPM) to analyse inhomogeneities in Nb$_{3}$Sn wires. Inhomogeneities of the A15 phase in Nb$_{3}$Sn sub-elements of a Ti-alloyed Restacked Rod Process wire and a Ta-alloyed Powder-In-Tube wire...
| Autores principales: | , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2023
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1361-6668/acb857 http://cds.cern.ch/record/2853518 |