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Analysis of inhomogeneities in Nb$_{3}$Sn wires by combined SEM and SHPM and their impact on J $_{c}$ and T $_{c}$

We demonstrate the combined use of scanning electron microscopy (SEM) and scanning Hall probe microscopy (SHPM) to analyse inhomogeneities in Nb$_{3}$Sn wires. Inhomogeneities of the A15 phase in Nb$_{3}$Sn sub-elements of a Ti-alloyed Restacked Rod Process wire and a Ta-alloyed Powder-In-Tube wire...

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Detalles Bibliográficos
Autores principales:	Pfeiffer, S, Baumgartner, T, Löffler, S, Stöger-Pollach, M, Hopkins, S C, Ballarino, A, Eisterer, M, Bernardi, J
Lenguaje:	eng
Publicado:	2023
Materias:	Accelerators and Storage Rings
Acceso en línea:	https://dx.doi.org/10.1088/1361-6668/acb857 http://cds.cern.ch/record/2853518

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