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Test on radiation damage to pin diodes

Detalles Bibliográficos
Autor principal: Paoluzzi, M
Lenguaje:eng
Publicado: 1985
Materias:
Acceso en línea:http://cds.cern.ch/record/2854050
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author Paoluzzi, M
author_facet Paoluzzi, M
author_sort Paoluzzi, M
collection CERN
id cern-2854050
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1985
record_format invenio
spelling cern-28540502023-08-16T15:44:22Zhttp://cds.cern.ch/record/2854050engPaoluzzi, MTest on radiation damage to pin diodesAccelerators and Storage RingsCERN-PS-RF-Note-85-9PS-RF-Note-85-9oai:cds.cern.ch:28540501985-11-20
spellingShingle Accelerators and Storage Rings
Paoluzzi, M
Test on radiation damage to pin diodes
title Test on radiation damage to pin diodes
title_full Test on radiation damage to pin diodes
title_fullStr Test on radiation damage to pin diodes
title_full_unstemmed Test on radiation damage to pin diodes
title_short Test on radiation damage to pin diodes
title_sort test on radiation damage to pin diodes
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/2854050
work_keys_str_mv AT paoluzzim testonradiationdamagetopindiodes