Cargando…
Test on radiation damage to pin diodes
Autor principal: | |
---|---|
Lenguaje: | eng |
Publicado: |
1985
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2854050 |
_version_ | 1780977289569239040 |
---|---|
author | Paoluzzi, M |
author_facet | Paoluzzi, M |
author_sort | Paoluzzi, M |
collection | CERN |
id | cern-2854050 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1985 |
record_format | invenio |
spelling | cern-28540502023-08-16T15:44:22Zhttp://cds.cern.ch/record/2854050engPaoluzzi, MTest on radiation damage to pin diodesAccelerators and Storage RingsCERN-PS-RF-Note-85-9PS-RF-Note-85-9oai:cds.cern.ch:28540501985-11-20 |
spellingShingle | Accelerators and Storage Rings Paoluzzi, M Test on radiation damage to pin diodes |
title | Test on radiation damage to pin diodes |
title_full | Test on radiation damage to pin diodes |
title_fullStr | Test on radiation damage to pin diodes |
title_full_unstemmed | Test on radiation damage to pin diodes |
title_short | Test on radiation damage to pin diodes |
title_sort | test on radiation damage to pin diodes |
topic | Accelerators and Storage Rings |
url | http://cds.cern.ch/record/2854050 |
work_keys_str_mv | AT paoluzzim testonradiationdamagetopindiodes |