Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number...

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Detalles Bibliográficos
Autores principales: Carnesecchi, F., Sabiu, B., Strazzi, S., Vignola, G., Agrawal, N., Alici, A., Antonioli, P., Arcelli, S., Bellini, F., Cavazza, D., Cifarelli, L., Colocci, M., Durando, S., Ercolessi, F., Falchieri, D., Ficorella, A., Fraticelli, C., Garbini, M., Giacalone, M., Gola, A., Hatzifotiadou, D., Jacazio, N., Margotti, A., Malfattore, G., Nania, R., Noferini, F., Paternoster, G., Pinazza, O., Preghenella, R., Rath, R., Ricci, R., Rignanese, L., Romanenko, G., Rubini, N., Scapparone, E., Scioli, G., Zichichi, A.
Lenguaje:eng
Publicado: 2023
Materias:
hep-ex
Particle Physics - Experiment
physics.ins-det
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1140/epjp/s13360-023-04397-0
http://cds.cern.ch/record/2860288

Internet

https://dx.doi.org/10.1140/epjp/s13360-023-04397-0
http://cds.cern.ch/record/2860288

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