Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number...

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Detalles Bibliográficos
Autores principales: Carnesecchi, F., Sabiu, B., Strazzi, S., Vignola, G., Agrawal, N., Alici, A., Antonioli, P., Arcelli, S., Bellini, F., Cavazza, D., Cifarelli, L., Colocci, M., Durando, S., Ercolessi, F., Falchieri, D., Ficorella, A., Fraticelli, C., Garbini, M., Giacalone, M., Gola, A., Hatzifotiadou, D., Jacazio, N., Margotti, A., Malfattore, G., Nania, R., Noferini, F., Paternoster, G., Pinazza, O., Preghenella, R., Rath, R., Ricci, R., Rignanese, L., Romanenko, G., Rubini, N., Scapparone, E., Scioli, G., Zichichi, A.
Lenguaje:eng
Publicado: 2023
Materias:
hep-ex
Particle Physics - Experiment
physics.ins-det
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1140/epjp/s13360-023-04397-0
http://cds.cern.ch/record/2860288
_version_ 1780977748698726400
author Carnesecchi, F.
Sabiu, B.
Strazzi, S.
Vignola, G.
Agrawal, N.
Alici, A.
Antonioli, P.
Arcelli, S.
Bellini, F.
Cavazza, D.
Cifarelli, L.
Colocci, M.
Durando, S.
Ercolessi, F.
Falchieri, D.
Ficorella, A.
Fraticelli, C.
Garbini, M.
Giacalone, M.
Gola, A.
Hatzifotiadou, D.
Jacazio, N.
Margotti, A.
Malfattore, G.
Nania, R.
Noferini, F.
Paternoster, G.
Pinazza, O.
Preghenella, R.
Rath, R.
Ricci, R.
Rignanese, L.
Romanenko, G.
Rubini, N.
Scapparone, E.
Scioli, G.
Zichichi, A.
author_facet Carnesecchi, F.
Sabiu, B.
Strazzi, S.
Vignola, G.
Agrawal, N.
Alici, A.
Antonioli, P.
Arcelli, S.
Bellini, F.
Cavazza, D.
Cifarelli, L.
Colocci, M.
Durando, S.
Ercolessi, F.
Falchieri, D.
Ficorella, A.
Fraticelli, C.
Garbini, M.
Giacalone, M.
Gola, A.
Hatzifotiadou, D.
Jacazio, N.
Margotti, A.
Malfattore, G.
Nania, R.
Noferini, F.
Paternoster, G.
Pinazza, O.
Preghenella, R.
Rath, R.
Ricci, R.
Rignanese, L.
Romanenko, G.
Rubini, N.
Scapparone, E.
Scioli, G.
Zichichi, A.
author_sort Carnesecchi, F.
collection CERN
description In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.
id cern-2860288
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2023
record_format invenio
spelling cern-28602882023-10-26T07:07:12Zdoi:10.1140/epjp/s13360-023-04397-0http://cds.cern.ch/record/2860288engCarnesecchi, F.Sabiu, B.Strazzi, S.Vignola, G.Agrawal, N.Alici, A.Antonioli, P.Arcelli, S.Bellini, F.Cavazza, D.Cifarelli, L.Colocci, M.Durando, S.Ercolessi, F.Falchieri, D.Ficorella, A.Fraticelli, C.Garbini, M.Giacalone, M.Gola, A.Hatzifotiadou, D.Jacazio, N.Margotti, A.Malfattore, G.Nania, R.Noferini, F.Paternoster, G.Pinazza, O.Preghenella, R.Rath, R.Ricci, R.Rignanese, L.Romanenko, G.Rubini, N.Scapparone, E.Scioli, G.Zichichi, A.Measurements of the Cherenkov effect in direct detection of charged particles with SiPMshep-exParticle Physics - Experimentphysics.ins-detDetectors and Experimental TechniquesIn this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.arXiv:2305.17762oai:cds.cern.ch:28602882023-05-28
spellingShingle hep-ex
Particle Physics - Experiment
physics.ins-det
Detectors and Experimental Techniques
Carnesecchi, F.
Sabiu, B.
Strazzi, S.
Vignola, G.
Agrawal, N.
Alici, A.
Antonioli, P.
Arcelli, S.
Bellini, F.
Cavazza, D.
Cifarelli, L.
Colocci, M.
Durando, S.
Ercolessi, F.
Falchieri, D.
Ficorella, A.
Fraticelli, C.
Garbini, M.
Giacalone, M.
Gola, A.
Hatzifotiadou, D.
Jacazio, N.
Margotti, A.
Malfattore, G.
Nania, R.
Noferini, F.
Paternoster, G.
Pinazza, O.
Preghenella, R.
Rath, R.
Ricci, R.
Rignanese, L.
Romanenko, G.
Rubini, N.
Scapparone, E.
Scioli, G.
Zichichi, A.
Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
title Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
title_full Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
title_fullStr Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
title_full_unstemmed Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
title_short Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
title_sort measurements of the cherenkov effect in direct detection of charged particles with sipms
topic hep-ex
Particle Physics - Experiment
physics.ins-det
Detectors and Experimental Techniques
url https://dx.doi.org/10.1140/epjp/s13360-023-04397-0
http://cds.cern.ch/record/2860288
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