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SEU injection framework for radiation-tolerant ASICs, a formal verification approach
Single Event Upsets (SEUs) represent a major challenge for digital electronics operated in a radiation environment. Triple Modular Redundancy (TMR) is one of the most popular approaches to increase digital electronics resilience to SEUs. Simulation is the most used approach for verifying the correct...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
2023
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/18/02/C02023 http://cds.cern.ch/record/2862125 |