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Low fluence implantations in GaAs: a Mössbauer spectroscopy investigation of individual and overlapping damage cascade

Detalles Bibliográficos
Autores principales:	Andreasen, H, Petersen, J W, Weyer, G
Lenguaje:	eng
Publicado:	1990
Materias:	Other Fields of Physics
Acceso en línea:	http://cds.cern.ch/record/286696

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