2nd International Conference on Large-scale Applications and Radiation Hardness of Semiconductor Detectors

Detalles Bibliográficos
Lenguaje:eng
Publicado: 1995
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/287212

Internet

http://cds.cern.ch/record/287212

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