Amorphous carbon thin films: Mechanisms of hydrogen incorporationduring magnetron sputtering and consequences for the secondary electronemission

Amorphous carbon (a-C) films, having low secondary electron yield (SEY), are usedat CERN to suppress electron multipacting in the beam pipes of particleaccelerators. It was already demonstrated that hydrogen impurities increase theSEY of a-C films. In this work, a systematic characterization of a se...

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Detalles Bibliográficos
Autores principales: Adame, C F, Alves, E, Barradas, N P, Costa Pinto, P, Delaup, Y, Ferreira, I M M, Neupert, H, Himmerlich, M, Pfeiffer, S, Rimoldi, M, Taborelli, M, Teodoro, O M N D, Bundaleski, N
Lenguaje:eng
Publicado: 2023
Acceso en línea:https://dx.doi.org/10.1116/6.0002759
http://cds.cern.ch/record/2875164

Internet

https://dx.doi.org/10.1116/6.0002759
http://cds.cern.ch/record/2875164

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