First beam tests of a Fast-RICH portotype with VLSI readout electronics

Detalles Bibliográficos
Autores principales: Mountain, R J, Séguinot, Jacques, Ypsilantis, Thomas, Jobez, J P, Arnold, R, Guyonnet, J L, Chesi, Enrico Guido, Tischhauser, Johann, Adachi, I, Sumiyoshi, T
Lenguaje:eng
Publicado: 1995
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/290123

Internet

http://cds.cern.ch/record/290123

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