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Defects studies in high-energy ion implanted semiconductors

Detalles Bibliográficos
Autores principales:	Weyer, G, Bonde-Nielsen, K, Fanciulli, M
Lenguaje:	eng
Publicado:	1994
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/298215

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