18th International Conference on Defects in Semiconductors

Proceedings of the 18th International Conference on Defects in Semiconductors (ICDS-18), Sendai, Japan, July 1995.

Detalles Bibliográficos
Autores principales: Katayama-Yoshida, Hiroshi, Suezawa, Masashi
Lenguaje:eng
Publicado: 1995
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/301628

Internet

http://cds.cern.ch/record/301628

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