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18th International Conference on Defects in Semiconductors
Proceedings of the 18th International Conference on Defects in Semiconductors (ICDS-18), Sendai, Japan, July 1995.
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
1995
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/301628 |
| _version_ | 1780889524598996992 |
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| author | Katayama-Yoshida, Hiroshi Suezawa, Masashi |
| author_facet | Katayama-Yoshida, Hiroshi Suezawa, Masashi |
| author_sort | Katayama-Yoshida, Hiroshi |
| collection | CERN |
| description | Proceedings of the 18th International Conference on Defects in Semiconductors (ICDS-18), Sendai, Japan, July 1995. |
| id | cern-301628 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1995 |
| record_format | invenio |
| spelling | cern-3016282021-04-22T21:23:08Zhttp://cds.cern.ch/record/301628engKatayama-Yoshida, HiroshiSuezawa, Masashi18th International Conference on Defects in SemiconductorsEngineeringProceedings of the 18th International Conference on Defects in Semiconductors (ICDS-18), Sendai, Japan, July 1995.oai:cds.cern.ch:3016281995 |
| spellingShingle | Engineering Katayama-Yoshida, Hiroshi Suezawa, Masashi 18th International Conference on Defects in Semiconductors |
| title | 18th International Conference on Defects in Semiconductors |
| title_full | 18th International Conference on Defects in Semiconductors |
| title_fullStr | 18th International Conference on Defects in Semiconductors |
| title_full_unstemmed | 18th International Conference on Defects in Semiconductors |
| title_short | 18th International Conference on Defects in Semiconductors |
| title_sort | 18th international conference on defects in semiconductors |
| topic | Engineering |
| url | http://cds.cern.ch/record/301628 |
| work_keys_str_mv | AT katayamayoshidahiroshi 18thinternationalconferenceondefectsinsemiconductors AT suezawamasashi 18thinternationalconferenceondefectsinsemiconductors |