Cargando…
Radiation hardness of silicon detectors manufactured on wafers from various sources
| Autores principales: | , , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
1996
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(97)00005-3 http://cds.cern.ch/record/305980 |