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Radiation hardness of silicon detectors manufactured on wafers from various sources
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
1996
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(97)00005-3 http://cds.cern.ch/record/305980 |
| _version_ | 1780889803023187968 |
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| author | Dezillie, B Bates, S Glaser, M Lemeilleur, F Leroy, C |
| author_facet | Dezillie, B Bates, S Glaser, M Lemeilleur, F Leroy, C |
| author_sort | Dezillie, B |
| collection | CERN |
| id | cern-305980 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1996 |
| record_format | invenio |
| spelling | cern-3059802019-09-30T06:29:59Zdoi:10.1016/S0168-9002(97)00005-3http://cds.cern.ch/record/305980engDezillie, BBates, SGlaser, MLemeilleur, FLeroy, CRadiation hardness of silicon detectors manufactured on wafers from various sourcesDetectors and Experimental TechniquesCERN-ECP-96-006CERN-ECP-96-06CERN-ECP-96-6oai:cds.cern.ch:3059801996-05-23 |
| spellingShingle | Detectors and Experimental Techniques Dezillie, B Bates, S Glaser, M Lemeilleur, F Leroy, C Radiation hardness of silicon detectors manufactured on wafers from various sources |
| title | Radiation hardness of silicon detectors manufactured on wafers from various sources |
| title_full | Radiation hardness of silicon detectors manufactured on wafers from various sources |
| title_fullStr | Radiation hardness of silicon detectors manufactured on wafers from various sources |
| title_full_unstemmed | Radiation hardness of silicon detectors manufactured on wafers from various sources |
| title_short | Radiation hardness of silicon detectors manufactured on wafers from various sources |
| title_sort | radiation hardness of silicon detectors manufactured on wafers from various sources |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/S0168-9002(97)00005-3 http://cds.cern.ch/record/305980 |
| work_keys_str_mv | AT dezillieb radiationhardnessofsilicondetectorsmanufacturedonwafersfromvarioussources AT batess radiationhardnessofsilicondetectorsmanufacturedonwafersfromvarioussources AT glaserm radiationhardnessofsilicondetectorsmanufacturedonwafersfromvarioussources AT lemeilleurf radiationhardnessofsilicondetectorsmanufacturedonwafersfromvarioussources AT leroyc radiationhardnessofsilicondetectorsmanufacturedonwafersfromvarioussources |