Soft x-ray spectromicroscopy and its application to semiconductor microstructure characterization

Detalles Bibliográficos
Autores principales: Gozzo, F, Franck, K, Howells, M R, Hussain, Z, Warwick, A, Padmore, H A, Triplett, B B
Lenguaje:eng
Publicado: 1996
Materias:
Condensed Matter
Acceso en línea:http://cds.cern.ch/record/310156

Internet

http://cds.cern.ch/record/310156

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