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Surface analysis with STM and AFM
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurem...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
VCH
1996
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/335789 |