Surface analysis with STM and AFM

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurem...

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Detalles Bibliográficos
Autores principales: Magonov, Sergi N, Whangbo, Myung-Hwan
Lenguaje:eng
Publicado: VCH 1996
Materias:
Other Fields of Physics
Acceso en línea:http://cds.cern.ch/record/335789
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author Magonov, Sergi N
Whangbo, Myung-Hwan
author_facet Magonov, Sergi N
Whangbo, Myung-Hwan
author_sort Magonov, Sergi N
collection CERN
description Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculat
id cern-335789
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1996
publisher VCH
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spelling cern-3357892021-04-22T03:27:50Zhttp://cds.cern.ch/record/335789engMagonov, Sergi NWhangbo, Myung-HwanSurface analysis with STM and AFMOther Fields of PhysicsScanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculatSergei N. Magonov, Myung-Hwan Whangbo Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to a lack of the proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical image analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip force induced surface corrugations. Practical examples are taken from: inorganic layered materials organic conductors organic adsorbates at liquid - solid interfaces self-assembled amphiphiles polymers This book will be an invaluable reference work for researchers active in STM and AFM as well as for newcomers to the field.VCHoai:cds.cern.ch:3357891996
spellingShingle Other Fields of Physics
Magonov, Sergi N
Whangbo, Myung-Hwan
Surface analysis with STM and AFM
title Surface analysis with STM and AFM
title_full Surface analysis with STM and AFM
title_fullStr Surface analysis with STM and AFM
title_full_unstemmed Surface analysis with STM and AFM
title_short Surface analysis with STM and AFM
title_sort surface analysis with stm and afm
topic Other Fields of Physics
url http://cds.cern.ch/record/335789
work_keys_str_mv AT magonovsergin surfaceanalysiswithstmandafm
AT whangbomyunghwan surfaceanalysiswithstmandafm

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