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Evolution of the Secondary Emission Efficiencies of various materials measured in the CERN SPS secondary beam lines
About 180 Secondary Emission Monitors (SEM) are used in the transfer lines to and from the CERN SPS for the measurement of profile, position and intensity of injected and ejected beams. Important changes, up to 50%, in the Secondary Emission Efficiencies (SEE) of Aluminium have been observed in the...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
1997
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| Acceso en línea: | http://cds.cern.ch/record/344272 |