Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics

Detalles Bibliográficos
Autores principales: Unno, Y, Nakao, M, Fujita, K, Ciocio, A, Dane, J, Dubbs, T, Emes, J, Gilchriese, M G D, Grillo, A, Haber, C, Handa, T, Holland, S, Iwasaki, H, Iwata, Y, Kashigin, S V, Kipnis, I, Kohriki, T, Kondo, T, Kröger, W, Lozano-Bahilo, J, Moorhead, G F, Ohsugi, T, Pier, S, Rowe, B, Sadrozinski, H F W, Shapiro, M, Siegrist, J L, Spencer, E, Spieler, H, Tamura, N, Takashima, R, Terada, S, Wilder, M
Lenguaje:eng
Publicado: 1997
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/345107

Internet

http://cds.cern.ch/record/345107

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