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Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics
| Autores principales: | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1997
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/345107 |
| _version_ | 1780891769935757312 |
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| author | Unno, Y Nakao, M Fujita, K Ciocio, A Dane, J Dubbs, T Emes, J Gilchriese, M G D Grillo, A Haber, C Handa, T Holland, S Iwasaki, H Iwata, Y Kashigin, S V Kipnis, I Kohriki, T Kondo, T Kröger, W Lozano-Bahilo, J Moorhead, G F Ohsugi, T Pier, S Rowe, B Sadrozinski, H F W Shapiro, M Siegrist, J L Spencer, E Spieler, H Tamura, N Takashima, R Terada, S Wilder, M |
| author_facet | Unno, Y Nakao, M Fujita, K Ciocio, A Dane, J Dubbs, T Emes, J Gilchriese, M G D Grillo, A Haber, C Handa, T Holland, S Iwasaki, H Iwata, Y Kashigin, S V Kipnis, I Kohriki, T Kondo, T Kröger, W Lozano-Bahilo, J Moorhead, G F Ohsugi, T Pier, S Rowe, B Sadrozinski, H F W Shapiro, M Siegrist, J L Spencer, E Spieler, H Tamura, N Takashima, R Terada, S Wilder, M |
| author_sort | Unno, Y |
| collection | CERN |
| id | cern-345107 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1997 |
| record_format | invenio |
| spelling | cern-3451072019-09-30T06:29:59Zhttp://cds.cern.ch/record/345107engUnno, YNakao, MFujita, KCiocio, ADane, JDubbs, TEmes, JGilchriese, M G DGrillo, AHaber, CHanda, THolland, SIwasaki, HIwata, YKashigin, S VKipnis, IKohriki, TKondo, TKröger, WLozano-Bahilo, JMoorhead, G FOhsugi, TPier, SRowe, BSadrozinski, H F WShapiro, MSiegrist, J LSpencer, ESpieler, HTamura, NTakashima, RTerada, SWilder, MBeam test of a large area n-on-n silicon strip detector with fast binary readout electronicsDetectors and Experimental Techniquesoai:cds.cern.ch:3451071997 |
| spellingShingle | Detectors and Experimental Techniques Unno, Y Nakao, M Fujita, K Ciocio, A Dane, J Dubbs, T Emes, J Gilchriese, M G D Grillo, A Haber, C Handa, T Holland, S Iwasaki, H Iwata, Y Kashigin, S V Kipnis, I Kohriki, T Kondo, T Kröger, W Lozano-Bahilo, J Moorhead, G F Ohsugi, T Pier, S Rowe, B Sadrozinski, H F W Shapiro, M Siegrist, J L Spencer, E Spieler, H Tamura, N Takashima, R Terada, S Wilder, M Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics |
| title | Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics |
| title_full | Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics |
| title_fullStr | Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics |
| title_full_unstemmed | Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics |
| title_short | Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics |
| title_sort | beam test of a large area n-on-n silicon strip detector with fast binary readout electronics |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/345107 |
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