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20th International Conference on Defects in Semiconductors

Detalles Bibliográficos
Autores principales: Van de Walle, Chris G, Walukiewicz, W
Lenguaje:eng
Publicado: 1999
Materias:
Acceso en línea:http://cds.cern.ch/record/389763
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author Van de Walle, Chris G
Walukiewicz, W
author_facet Van de Walle, Chris G
Walukiewicz, W
author_sort Van de Walle, Chris G
collection CERN
id cern-389763
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1999
record_format invenio
spelling cern-3897632021-07-30T13:21:38Z http://cds.cern.ch/record/389763 eng Van de Walle, Chris G Walukiewicz, W 20th International Conference on Defects in Semiconductors Condensed Matter 1999
spellingShingle Condensed Matter
Van de Walle, Chris G
Walukiewicz, W
20th International Conference on Defects in Semiconductors
title 20th International Conference on Defects in Semiconductors
title_full 20th International Conference on Defects in Semiconductors
title_fullStr 20th International Conference on Defects in Semiconductors
title_full_unstemmed 20th International Conference on Defects in Semiconductors
title_short 20th International Conference on Defects in Semiconductors
title_sort 20th international conference on defects in semiconductors
topic Condensed Matter
url http://cds.cern.ch/record/389763
work_keys_str_mv AT vandewallechrisg 20thinternationalconferenceondefectsinsemiconductors
AT walukiewiczw 20thinternationalconferenceondefectsinsemiconductors