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20th International Conference on Defects in Semiconductors
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
1999
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/389763 |
_version_ | 1780893677832372224 |
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author | Van de Walle, Chris G Walukiewicz, W |
author_facet | Van de Walle, Chris G Walukiewicz, W |
author_sort | Van de Walle, Chris G |
collection | CERN |
id | cern-389763 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1999 |
record_format | invenio |
spelling | cern-3897632021-07-30T13:21:38Z http://cds.cern.ch/record/389763 eng Van de Walle, Chris G Walukiewicz, W 20th International Conference on Defects in Semiconductors Condensed Matter 1999 |
spellingShingle | Condensed Matter Van de Walle, Chris G Walukiewicz, W 20th International Conference on Defects in Semiconductors |
title | 20th International Conference on Defects in Semiconductors |
title_full | 20th International Conference on Defects in Semiconductors |
title_fullStr | 20th International Conference on Defects in Semiconductors |
title_full_unstemmed | 20th International Conference on Defects in Semiconductors |
title_short | 20th International Conference on Defects in Semiconductors |
title_sort | 20th international conference on defects in semiconductors |
topic | Condensed Matter |
url | http://cds.cern.ch/record/389763 |
work_keys_str_mv | AT vandewallechrisg 20thinternationalconferenceondefectsinsemiconductors AT walukiewiczw 20thinternationalconferenceondefectsinsemiconductors |