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Deep level defects in semiconductor detectors
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
1995
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/391205 |
_version_ | 1780893731786850304 |
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author | Lutz, Gerhard |
author_facet | Lutz, Gerhard |
author_sort | Lutz, Gerhard |
collection | CERN |
id | cern-391205 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1995 |
record_format | invenio |
spelling | cern-3912052019-09-30T06:29:59Zhttp://cds.cern.ch/record/391205engLutz, GerhardDeep level defects in semiconductor detectorsDetectors and Experimental TechniquesMPI-PHE-95-27oai:cds.cern.ch:3912051995 |
spellingShingle | Detectors and Experimental Techniques Lutz, Gerhard Deep level defects in semiconductor detectors |
title | Deep level defects in semiconductor detectors |
title_full | Deep level defects in semiconductor detectors |
title_fullStr | Deep level defects in semiconductor detectors |
title_full_unstemmed | Deep level defects in semiconductor detectors |
title_short | Deep level defects in semiconductor detectors |
title_sort | deep level defects in semiconductor detectors |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/391205 |
work_keys_str_mv | AT lutzgerhard deepleveldefectsinsemiconductordetectors |