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Deep level defects in semiconductor detectors

Detalles Bibliográficos
Autor principal: Lutz, Gerhard
Lenguaje:eng
Publicado: 1995
Materias:
Acceso en línea:http://cds.cern.ch/record/391205
_version_ 1780893731786850304
author Lutz, Gerhard
author_facet Lutz, Gerhard
author_sort Lutz, Gerhard
collection CERN
id cern-391205
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1995
record_format invenio
spelling cern-3912052019-09-30T06:29:59Zhttp://cds.cern.ch/record/391205engLutz, GerhardDeep level defects in semiconductor detectorsDetectors and Experimental TechniquesMPI-PHE-95-27oai:cds.cern.ch:3912051995
spellingShingle Detectors and Experimental Techniques
Lutz, Gerhard
Deep level defects in semiconductor detectors
title Deep level defects in semiconductor detectors
title_full Deep level defects in semiconductor detectors
title_fullStr Deep level defects in semiconductor detectors
title_full_unstemmed Deep level defects in semiconductor detectors
title_short Deep level defects in semiconductor detectors
title_sort deep level defects in semiconductor detectors
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/391205
work_keys_str_mv AT lutzgerhard deepleveldefectsinsemiconductordetectors