Radiation damage tests of GaAs HV switches for MSGCs bias control

Detalles Bibliográficos
Autores principales: Bisogni, M G, Bottigli, U, Fantacci, M E, Stefanini, A, Bertolucci, Ennio, Conti, M, Russo, P, Cola, A, Quaranta, F, Vasanelli, L, Stefanini, G
Lenguaje:eng
Publicado: 1999
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(98)01495-8
http://cds.cern.ch/record/395154

Internet

https://dx.doi.org/10.1016/S0168-9002(98)01495-8
http://cds.cern.ch/record/395154

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