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Radiation hardened transistor characteristics for applications at LHC and beyond
The high radiation environment at the LHC will require the use of radiation hardened microelectronics for the readout of inner detectors. Two such technologies are a Harris bulk CMOS process and the DMILL mixed technology process. Transistors have been fabricated in both of these and have been teste...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
1997
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/400303 |