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Investigation of deep-level Fe-centres in silicon by Mössbauer spectroscopy

Detalles Bibliográficos
Autor principal: Weyer, G
Lenguaje:eng
Publicado: 1999
Materias:
Acceso en línea:http://cds.cern.ch/record/410416
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author Weyer, G
author_facet Weyer, G
author_sort Weyer, G
collection CERN
id cern-410416
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1999
record_format invenio
spelling cern-4104162021-01-15T13:26:59Zhttp://cds.cern.ch/record/410416engWeyer, GInvestigation of deep-level Fe-centres in silicon by Mössbauer spectroscopyDetectors and Experimental TechniquesCERN-ISTC-99-6ISTC-P-85-Add-1oai:cds.cern.ch:4104161999-11-08
spellingShingle Detectors and Experimental Techniques
Weyer, G
Investigation of deep-level Fe-centres in silicon by Mössbauer spectroscopy
title Investigation of deep-level Fe-centres in silicon by Mössbauer spectroscopy
title_full Investigation of deep-level Fe-centres in silicon by Mössbauer spectroscopy
title_fullStr Investigation of deep-level Fe-centres in silicon by Mössbauer spectroscopy
title_full_unstemmed Investigation of deep-level Fe-centres in silicon by Mössbauer spectroscopy
title_short Investigation of deep-level Fe-centres in silicon by Mössbauer spectroscopy
title_sort investigation of deep-level fe-centres in silicon by mössbauer spectroscopy
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/410416
work_keys_str_mv AT weyerg investigationofdeeplevelfecentresinsiliconbymossbauerspectroscopy