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Doping of sapphire single crystals with $^{111}$In and $^{111m}$Cd detected by perturbed angular correlation
The electric hyperfine interaction of ion beam implanted /sup 111/In and /sup 111m/Cd probe atoms in sapphire (Al/sub 2/O/sub 3/) single crystals has been investigated using perturbed angular correlation spectroscopy. For both probe atoms the same distinctive electric field gradient was found, indic...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
1999
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1023/A:1017049523366 http://cds.cern.ch/record/419567 |