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Investigation on the improved radiation hardness of silicon detectors with high oxygen concentration

We present an investigation on the influence of the oxygen concentration on radiation-induced changes in the effective doping concentration of silicon detectors. Diodes fabricated from silicon with interstitial oxygen content ranging from below 2*10/sup 14/ to 9*10/sup 17/ cm/sup -3/ have been irrad...

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Detalles Bibliográficos
Autores principales: Moll, Michael, Fretwurst, E, Lindström, G
Lenguaje:eng
Publicado: 2000
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(99)00842-6
http://cds.cern.ch/record/427352