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Experimental evaluation of niobium film pinholes [for LEP cavities]
To assess the quality of vacuum-deposited films, well-defined areas of free-hanging thin film may be obtained by chemically dissolving the substrate on a fraction of its surface. A global evaluation of the thin film pinholes is then possible by measuring the gas conductance across the film. To do so...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
1999
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0042-207X(00)00388-2 http://cds.cern.ch/record/435198 |