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Effect of actual cabling pattern on the critical current of a multistage CIC

Detalles Bibliográficos
Autores principales: Schild, T, Ciazynski, D, Court, S
Lenguaje:eng
Publicado: 1999
Materias:
Acceso en línea:http://cds.cern.ch/record/440777
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author Schild, T
Ciazynski, D
Court, S
author_facet Schild, T
Ciazynski, D
Court, S
author_sort Schild, T
collection CERN
id cern-440777
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1999
record_format invenio
spelling cern-4407772019-09-30T06:29:59Zhttp://cds.cern.ch/record/440777engSchild, TCiazynski, DCourt, SEffect of actual cabling pattern on the critical current of a multistage CICEngineeringDAPNIA-STCM-99-23oai:cds.cern.ch:4407771999
spellingShingle Engineering
Schild, T
Ciazynski, D
Court, S
Effect of actual cabling pattern on the critical current of a multistage CIC
title Effect of actual cabling pattern on the critical current of a multistage CIC
title_full Effect of actual cabling pattern on the critical current of a multistage CIC
title_fullStr Effect of actual cabling pattern on the critical current of a multistage CIC
title_full_unstemmed Effect of actual cabling pattern on the critical current of a multistage CIC
title_short Effect of actual cabling pattern on the critical current of a multistage CIC
title_sort effect of actual cabling pattern on the critical current of a multistage cic
topic Engineering
url http://cds.cern.ch/record/440777
work_keys_str_mv AT schildt effectofactualcablingpatternonthecriticalcurrentofamultistagecic
AT ciazynskid effectofactualcablingpatternonthecriticalcurrentofamultistagecic
AT courts effectofactualcablingpatternonthecriticalcurrentofamultistagecic