Radiation hard position-sensitive cryogenic silicon detectors: the Lazarus effect

The discovery of the so-called Lazarus effect, namely the recovery of the charge collection efficiency (CCE) of irradiated silicon detectors by means of cryogenic cooling has entailed an increasing interest in the behavior of silicon detectors at cryogenic temperatures. We have measured the CCE of a...

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Detalles Bibliográficos
Autores principales: Palmieri, V G, Abreu, M C, Bell, W H, Berglund, P, de Boer, Wim, Borchi, E, Borer, K, Bruzzi, Mara, Buontempo, S, Casagrande, L, Chapuy, S, Cindro, V, D'Ambrosio, N, Via, D, Devine, S R H, Dezillie, B, Dimcovski, Zlatomir, Eremin, V V, Esposito, A P, Granata, V, Grigoriev, E, Hauler, F, Heijne, Erik H M, Heising, S, Janos, S, Jungermann, L, Konorov, I, Li, Z, Lourenço, C, Mikuz, M, Niinikoski, T O, O'Shea, V, Pagano, S, Paul, S, Pirollo, S, Pretzl, Klaus P, Rato-Mendes, P, Ruggiero, G, Smith, K, Sonderegger, P, Sousa, P, Verbitskaya, E, Watts, S, Zavrtanik, M
Lenguaje:eng
Publicado: 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0921-4526(99)01853-0
http://cds.cern.ch/record/445005

Internet

https://dx.doi.org/10.1016/S0921-4526(99)01853-0
http://cds.cern.ch/record/445005

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