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High-resolution x-ray scattering from thin films and multilayers
Autores principales: | , , |
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Lenguaje: | eng |
Publicado: |
Springer
1999
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/BFb0109385 http://cds.cern.ch/record/445085 |