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High-resolution x-ray scattering from thin films and multilayers

Detalles Bibliográficos
Autores principales:	Holy, V, Baumbach, T, Pietsch, U
Lenguaje:	eng
Publicado:	Springer 1999
Materias:	Condensed Matter
Acceso en línea:	https://dx.doi.org/10.1007/BFb0109385 http://cds.cern.ch/record/445085

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