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Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology
| Autores principales: | , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1999
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/446352 |
| _version_ | 1780895967574228992 |
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| author | Faccio, F Anelli, G Campbell, M Delmastro, M Jarron, Pierre Kloukinas, Kostas C Marchioro, A Moreira, P Noah, E Snoeys, W Calin, T Cosculluela, J Velazco, R Nicolaidis, M Giraldo, A |
| author_facet | Faccio, F Anelli, G Campbell, M Delmastro, M Jarron, Pierre Kloukinas, Kostas C Marchioro, A Moreira, P Noah, E Snoeys, W Calin, T Cosculluela, J Velazco, R Nicolaidis, M Giraldo, A |
| author_sort | Faccio, F |
| collection | CERN |
| id | cern-446352 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1999 |
| record_format | invenio |
| spelling | cern-4463522020-02-06T20:53:34Zhttp://cds.cern.ch/record/446352engFaccio, FAnelli, GCampbell, MDelmastro, MJarron, PierreKloukinas, Kostas CMarchioro, AMoreira, PNoah, ESnoeys, WCalin, TCosculluela, JVelazco, RNicolaidis, MGiraldo, ATotal dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technologyDetectors and Experimental Techniquesoai:cds.cern.ch:4463521999 |
| spellingShingle | Detectors and Experimental Techniques Faccio, F Anelli, G Campbell, M Delmastro, M Jarron, Pierre Kloukinas, Kostas C Marchioro, A Moreira, P Noah, E Snoeys, W Calin, T Cosculluela, J Velazco, R Nicolaidis, M Giraldo, A Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology |
| title | Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology |
| title_full | Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology |
| title_fullStr | Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology |
| title_full_unstemmed | Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology |
| title_short | Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology |
| title_sort | total dose and single event effects (see) in a $0.25-\mu-m$ cmos technology |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/446352 |
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