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Total dose and single event effects (SEE) in a $0.25-\mu-m$ CMOS technology

Detalles Bibliográficos
Autores principales:	Faccio, F, Anelli, G, Campbell, M, Delmastro, M, Jarron, Pierre, Kloukinas, Kostas C, Marchioro, A, Moreira, P, Noah, E, Snoeys, W, Calin, T, Cosculluela, J, Velazco, R, Nicolaidis, M, Giraldo, A
Lenguaje:	eng
Publicado:	1999
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/446352

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