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New results on silicon microstrip detectors of CMS tracker
Interstrip and backplane capacitances on silicon microstrip detectors with pf strip on n substrate of 320 mu m thickness were measured for pitches between 60 and 240 mu m and width over pitch ratios between 0.13 and 0.5. Parametrisations of capacitance w.r.t. pitch and width were compared with data....
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Lenguaje: | eng |
Publicado: |
2000
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(00)00182-0 http://cds.cern.ch/record/449537 |