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New results on silicon microstrip detectors of CMS tracker

Interstrip and backplane capacitances on silicon microstrip detectors with pf strip on n substrate of 320 mu m thickness were measured for pitches between 60 and 240 mu m and width over pitch ratios between 0.13 and 0.5. Parametrisations of capacitance w.r.t. pitch and width were compared with data....

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Detalles Bibliográficos
Autores principales: Demaria, N, Albergo, S, Angarano, M M, Azzi, P, Babucci, E, Bacchetta, N, Bader, A J, Bagliesi, G, Basti, A, Biggeri, U, Bilei, G M, Bisello, D, Boemi, D, Bölla, G, Bosi, F, Borello, L, Bortoletto, Daniela, Bozzi, C, Braibant, S, Breuker, Horst, Bruzzi, Mara, Buffini, A, Busoni, S, Candelori, A, Caner, A, Castaldi, R, Castro, A, Catacchini, E, Checcucci, B, Ciampolini, P, Civinini, C, Creanza, D, D'Alessandro, R, Da Rold, M, De Palma, M, Dell'Orso, R, Della Marina, R, Dutta, S, Eklund, C, Peisert, Anna, Favro, G, Feld, L, Fiore, L, Focardi, E, French, M, Freudenreich, Klaus, Fürtjes, A, Giassi, A, Giorgi, M A, Giraldo, A, Glessing, B, Gu, W H, Hall, G, Hammarström, R, Hebbeker, T, Hrubec, Josef, Huhtinen, M, Kaminski, A, Karimäki, V, Saint-Koenig, M, Krammer, Manfred, Lariccia, P, Lenzi, M, Loreti, M, Lübelsmeyer, K, Lustermann, W, Mättig, P, Maggi, G, Mannelli, M, Mantovani, G C, Marchioro, A, Mariotti, C, Martignon, G, McEvoy, B, Meschini, M, Messineo, A, Migliore, E, My, S, Paccagnella, A, Palla, Fabrizio, Pandoulas, D, Papi, A, Parrini, G, Passeri, D, Pieri, M, Piperov, S, Potenza, R, Radicci, V, Raffaelli, F, Raymond, M, Santocchia, A, Schmitt, B, Selvaggi, G, Servoli, L, Sguazzoni, G, Siedling, R, Silvestris, L, Skog, K, Starodumov, Andrei, Stavitski, I, Stefanini, G, Tempesta, P, Tonelli, G, Tricomi, A, Tuuva, T, Vannini, C, Verdini, P G, Viertel, Gert M, Xie, Z, Li, Y, Watts, S, Wittmer, B
Lenguaje:eng
Publicado: 2000
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(00)00182-0
http://cds.cern.ch/record/449537