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Performance and Irradiation Tests of the 0.3$\mu$m CMOS TDC for the ATLAS MDT
ATLAS Muon TDC test-element group chip (AMTTEG) was developed and tested to confirm the performance of critical circuits of the TDC and measure radiation tolerance of the process. The chip was fabricated in a 0.3 mm CMOS Gate-Array technology. Measurements of critical elements of the chip such as th...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
CERN
1999
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-1999-009.462 http://cds.cern.ch/record/472693 |