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Study of the residual surface resistance of niobium films at 1.5 GHz
Potential contributions to the residual surface resistance of niobium films exposed to 1.5 GHz microwaves are reviewed and studied. These include the oxidation of the film surface, the formation of hydride precipitates, the contamination by noble gas atoms and the presence of macroscopic film defect...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2000
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/477070 |