Study of the residual surface resistance of niobium films at 1.5 GHz

Potential contributions to the residual surface resistance of niobium films exposed to 1.5 GHz microwaves are reviewed and studied. These include the oxidation of the film surface, the formation of hydride precipitates, the contamination by noble gas atoms and the presence of macroscopic film defect...

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Detalles Bibliográficos
Autores principales: Calatroni, Sergio, Benvenuti, Cristoforo, Darriulat, Pierre, Peck, M A, Valente, A M, Van't Hof, C A
Lenguaje:eng
Publicado: 2000
Materias:
Accelerators and Storage Rings
Acceso en línea:http://cds.cern.ch/record/477070

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